Automobile Industry

After the workpiece is processed, it is necessary to measure the accuracy of the workpiece or instrument to determine whether it is qualified, but some workpiece is affected by its shape, the contour is composed of many different geometric elements, such as straight line, arc, quadratic curve, etc., may not be able to measure it or the measurement efficiency is low, can not meet the needs of the work; The measurement of the inner cavity size of the workpiece is always difficult for the production enterprise, so the measurement method of the inner cavity size of the workpiece has many limitations.

As a standard part, the nut plays an important role in the linkage and transmission of mechanical parts, and is a component that must be used in all production and manufacturing machinery. Among them, the precision of the inner hole of the precision nut is relatively high, if the internal thread processing is not in place, it will not be able to correctly connect with the screw, so the internal thread of the nut needs to be tested.

As shown in the picture below: Requirements to measure the thickness of yellow wafer thin film through understanding customer needs to know the measurement film accuracy requirements of μm level, according to customer requirements and product observation technicians, D15A32 with H4UO one-third range controller, D15A32 has an ultra-small spot size, bringing higher linear accuracy and higher resolution, Suitable for measuring roughness with high resolution. Through scanning measurement, it can be seen that the film thickness of 13.914μm (repetition accuracy) Shenzhen Lihe Technology since its establishment in 2014, so far 8 years, specializing in the production and development of spectral confocal displacement sensors, after 8 years of continuous product repetition accuracy up to...

As the silicon wafer is opaque and reflective items, this test adopts D40A36 with dual channel H4UC controller, D40A36 has a small spot, higher resolution and measurement accuracy, very suitable for measuring high-precision, high-resolution and reflective items. The blue curve is the height data curve of the upper lens, and the red curve is the height data curve of the lower lens. The thickness curve can be calculated by the height value of the upper and lower lenses. (Thickness value of silicon wafer) This measurement is made by collecting the numerical measurement value of the upper and lower lens height of the sample, and calculating the thickness value.

Test requirements to measure the width and height difference of pipe thread (as shown in the figure above) First fix the measured object, fix the 90-degree lens position, and scan the sampling frequency of 3000Hz from left to right inside the tube. Scanning step 2μm start scanning (30 times measurement repeatability data) This test adopts Lihe Technology D35A18R4S25-90 lens to scan the upper surface profile of the internal thread of the sample, lens dynamic scanning test, The sampling frequency of 3000Hz/s sweeps the contour of the upper surface of the thread, and the accuracy range of 30 repeats is 8.5um. The 90-degree lens range of 8mm can cover the depth and width of the detection thread.