White confocal technology is used in precision measurement and 3D measurement

For the measurement of optical lens surface profile, the commonly used measurement methods include probe method and white light interference method. Color laser displacement coaxial measuring instrument uses white light as measuring medium, white light will form dispersion effect in special lens group. Different depths of the object under test reflect different colors of light, thus measuring the distance and displacement of the probe to the surface of the object under test.

It is particularly suitable for measuring fully reflective surfaces such as mirrors, because unlike laser triangular reflection sensors, the light source is perpendicular to the object being measured, the reflection is also perpendicular to the probe, and the mirror can reflect the light spot to the maximum extent. The triangular reflection sensor is more suitable for the measurement of scattered surfaces.

Ultra-high resolution can be obtained by using spectral confocal sensor measurement. The nanoscale resolution is obtained by extending the spectral range obtained through the special treatment described above. Since the color of the detection focus is used to obtain distance information, spectral confocal sensors can use very small measurement points, allowing very small objects to be measured. This also means that even the slightest scratch on the surface of the meter being measured cannot escape the eye of the spectral confocal sensor.

White light interferometry is a non-contact optical measurement method, which avoids the problems existing in the contact measurement method and has high measurement accuracy. However, the white light confocal method requires image splicing to obtain a complete contour, and image splicing will produce errors, so it is not suitable for measuring the lens contour of large volume or array distribution.

The spectral confocal sensor has the advantages of the above two measurement methods, but also has ultra-high Angle characteristics, the measurement frequency can reach 2000Hz, and has a high-precision measurement platform, which ensures the horizontal resolution of the contour data and realizes the requirements of precision measurement and three-dimensional measurement.